Modifying the Scan Chains in Sequential Circuit to Reduce Leakage Current

Our method uses the built-in scan-chain in a VLSI circuit to drive it with the minimum leakage vector when it enters the sleep mode. Using these scan registers eliminates the area and delay overhead of the additional circuitry that would otherwise be needed to apply the minimum leakage vector to the circuit. We show how the proposed technique can be used for several different scan-chain architectures and present the experimental results on the MCNC91 benchmark circuits. General TermsCMOS VLSI, sub-threshold, Leakage current